Nutfield Technology (Windham, NH; www.nutfieldtech.com) announces the 3XB Dual Wavelength large field 3-axis scan head.
3XB Dual Wavelength technology allows system designers to employ a single scan head for use with both 532nm and 1064nm lasers. This provides a significant economic advantage by reducing scan head inventories for production installations where both wavelengths are used.
3XB Dual Wavelength capability also enables R&D efforts to use a single scan head to experiment with 532nm and 1064nm lasers.
Job shops save money and expand their application envelope by employing a 3XB Dual Wavelength scan head that works with both 532nm and 1064nm lasers.
Nutfield 3XB Dual Wavelength Scan Heads offer small spot diameters and large scan field sizes to laser system designers. Capable of producing scan fields of up to 2m x 2m, typical 3XB Dual Wavelength specs are:
-532nm: 7µm spot diameter at 150mm x 150mm field
-1064nm: 14µm spot diameter at 150mm x 150mm field
-532nm: 19µm spot diameter at 500mm x 500mm field
-1064nm: 38µm spot diameter at 500mm x 500mm field
3XB Dual Wavelength allows the user to adjust scan field and spot size by simply turning a knob. This allows system designers to experiment with and dial in the optimum field/spot size combination for the application.
The Z-axis (third axis) of the 3XB Dual Wavelength corrects for focus, in real-time, within the scan field, allowing the use of large aperture input beams for scanning large scan fields and small spot diameters.
The 3XB Dual Wavelength Large Field 3-Axis Scan Heads offer a solution for a variety of scanning applications, including: scribing, edge deletion, grooving, cutting, marking, engraving, and many others.
