Ophir Photonics (North Logan, UT) has debuted its NanoScan 2s scanning slit beam profiler for instant measurement of beam position and size with sub-micron precision for continuous-wave (CW) and kilohertz pulsed lasers. The profiler offers silicon, germanium, or pyroelectric detectors to allow profiling lasers of any wavelength. The beam profiler uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts. A digital controller provides deep, 16-bit digitization of the signal for high dynamic range up to 35dB power, making it possible to measure beam size and beam pointing with 3-sigma precision to several hundred nanometers. The silicon- and germanium detector-based versions include an integrated 200mW power meter that displays both total power and individual power in each of the beams being measured.
NanoScan 2s software can measure from one to 16 beams in the aperture with sub-micron precision. A beam can be found in <0.3s and real-time updates can be displayed to 20Hz.
For more information, please visit www.ophiropt.com/photonics.