Education: Mechanical Engineering; BS Virgina Tech, MS & Ph.D. UNC Charlotte
Kate comes with a strong metrology background through work at NIST and her Ph.D. work from the Center for Precision Metrology at UNC Charlotte. Within the study of precision engineering, she focused on metrology and more specifically, on the interferometric measurement of optical surfaces.
Kate most recently worked for a company in Europe developing metrology tools and has over 10 years in research experience. Kate recently joined our R&D team as the resident metrology expert. She has the expertise to discern between good and bad interferometric measurements and can help achieve highly accurate and reliable results. As Optimax achieves better and better metrology solutions, we will be able to improve our processes to manufacture optical components to tighter tolerances and expand our capabilities.