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    Super-res PALM and SIM system by Carl Zeiss Microscopy

    Nov. 11, 2013
    The ELYRA P.1 super-resolution photoactivated localization microscopy (PALM) and super-resolution structured illumination microscopy (SR-SIM) system from Carl Zeiss Microscopy enables imaging of highly resolved structures in 2D and 3D with minimal disruption for long-term observation.

    The ELYRA P.1 super-resolution photoactivated localization microscopy (PALM) and super-resolution structured illumination microscopy (SR-SIM) system from Carl Zeiss Microscopy (Jena, Germany) enables imaging of highly resolved structures in 2D and 3D with minimal disruption for long-term observation. Resolutions range from 20 to 30 nm laterally and 50 to 80 nm axially. The system also integrates with the company's LSM 710 or LSM 780 laser scanning microscopes as well as scanning electron microscopes in a correlative workflow.

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