Hybrid positioner for optical microscopy by Piezoconcept

    July 1, 2016
    The Hybrid System positioner has uses with standard inverted optical microscopes for applications such as super-resolution microscopy, particle tracking, and confocal microscopy.
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    The Hybrid System positioner from Piezoconcept (Lyon, France) has uses with standard inverted optical microscopes for applications such as super-resolution microscopy, particle tracking, and confocal microscopy. The system combines a manual micrometer-driven, two-axis linear motion stage with high-resolution, ultra-low profile nanopositioners to provide up to 300 µm in all directions. An additional breadboard is also available on request.

    For more information, please visit www.piezoconcept.com.

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