Hybrid positioner for optical microscopy by Piezoconcept

July 1, 2016
The Hybrid System positioner has uses with standard inverted optical microscopes for applications such as super-resolution microscopy, particle tracking, and confocal microscopy.

The Hybrid System positioner from Piezoconcept (Lyon, France) has uses with standard inverted optical microscopes for applications such as super-resolution microscopy, particle tracking, and confocal microscopy. The system combines a manual micrometer-driven, two-axis linear motion stage with high-resolution, ultra-low profile nanopositioners to provide up to 300 µm in all directions. An additional breadboard is also available on request.

For more information, please visit www.piezoconcept.com.

Voice your opinion!

To join the conversation, and become an exclusive member of Laser Focus World, create an account today!