BURN-IN, RELIABILITY & LIFE TEST SYSTEM
Chroma 58602 is a high density, precision multi Source Measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-In, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, Silicon Photonics, photo-diodes and other similar components. Each module is an independent Ethernet controlled instrument with up to 768 discrete laser drive sources (6 modules contain up to 4608 drive sources per system), which may be used as Device Drives, Device Biasing and/or Measurement Operations. The system's high density allows for optimized clean room space.
SOURCE AND MEASUREMENT
Discrete voltage measurements are available for high current devices placed in series. Multiple current sources may also be paralleled (exchanging the conversion interface board) to support higher power devices.
Chroma brings the Change Kit flexibility used in the semiconductor industry to optoelectronics. Through the Change Kit the 58602 can be configured to other devices in minutes for:
■ High Channel Density
■ Higher Currents
■ Optical Power Monitoring
■ Monitor Photodiode Measurements / Dark Current Measurements
■ Component Biasing
■ Multiple Device Types
Seamlessly integrates with Chroma’s 58620 (EEL) or 58635 (VCSEL WAT) functional testers to reduce handling and increase yield.
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