Delivering a Modular Thin-Film Metrology Solution for Photovoltaic Research and Manufacturing 

TAMPA, Fla. — As photovoltaic technologies continue to advance—from high-efficiency silicon solar cells to perovskite, tandem, CdTe, and CIGS devices—the ability to accurately characterize thin-film coatings has become increasingly important. Researchers and process engineers require not only precise thin-film thickness measurements, but also measurement solutions that can evolve alongside new materials, manufacturing processes, and research objectives. 

To support this growing need, StellarNet has expanded its thin-film metrology portfolio with the introduction of the TF-Micro™ Thin-Film Measurement Microscope, a modular microscope-based system designed for precision thin-film thickness measurements. 

Built on StellarNet's modular instrumentation philosophy, the TF-Micro system allows laboratories to configure the capabilities they need today while providing a straightforward upgrade path as measurement requirements evolve. 

Researchers interested in photovoltaic coating characterization can learn more about Solar & Photovoltaic Thin-Film Measurement Systems by visiting: https://www.stellarnet.us/systems/thin-film-metrology/solar-photovoltaic-measurement/

The TF-Micro Thin-Film Measurement Microscope combines high-resolution microscope imaging with StellarNet's Thin-Film Metrology software to deliver accurate film thickness measurements. Laboratories can enhance the system over time with TF-AM™ Automated Mapping and Surface Quality Verification™, allowing the same instrument to support increasingly sophisticated measurement workflows without replacing the core system. 

"At StellarNet, we've always believed instrumentation should grow with the customer," said Jason Pierce of StellarNet. "Rather than requiring laboratories to purchase capabilities they may not need today, the TF-Micro family allows researchers to begin with the measurement system that best fits their application and expand into automation and advanced imaging workflows as their research evolves." 

TF-AM™ Automated Mapping

TF-AM ™ Automated Mapping enhances the TF-Micro system by automating precision thin-film thickness measurements across user-defined grids, lines, and regions of interest.

Instead of manually repositioning the sample for every measurement, researchers can automatically generate detailed thin-film thickness maps while recording:

•       Thin-film thickness

•       Optical reflectance spectra

•       Optical model calculations

•       Measurement coordinates

•       Complete measurement documentation

Automated mapping improves repeatability, increases measurement throughput, and provides a more comprehensive understanding of coating uniformity and process variation. 

Surface Quality Verification™

Surface Quality Verification™ integrates microscope imaging directly into the measurement workflow, allowing users to visually verify and document each measurement location before collecting spectral data. 

The imaging workflow assists users in identifying visible surface conditions that may influence measurement quality, including:

•       Dust and particulate contamination

•       Fibers and lint

•       Hair and debris

•       Large droplets or surface residue

•       Sample edges

•       Sample fixtures or measurement obstructions

•       General measurement location suitability

By documenting the measurement area before analysis, researchers can improve confidence in their measurements while maintaining a permanent visual record of every analyzed location. 

Designed for Advanced Photovoltaic Materials

The TF-Micro system supports precision thin-film characterization across a broad range of photovoltaic materials and coating technologies, including:

•       Silicon Nitride Anti-Reflective Coatings

•       Transparent Conductive Oxides (ITO, AZO, ZnO)

•       Perovskite Solar Cells

•       Tandem Solar Cells

•       Cadmium Telluride (CdTe)

•       Copper Indium Gallium Selenide (CIGS)

•       Experimental Thin-Film Photovoltaic Materials

Depending on the selected configuration, users can perform precision manual measurements, automated mapping, imaging-assisted verification, or combine these capabilities within a common Thin-Film Metrology software environment.

A Modular Approach to Thin-Film Metrology

The TF-Micro family reflects StellarNet's long-standing modular instrumentation philosophy. Rather than requiring laboratories to purchase a fully configured system, users can build a thin-film measurement solution around their current applications while maintaining a clear path for future expansion. 

Researchers can begin with the core TF-Micro Thin-Film Measurement Microscope and add TF-AM™ Automated Mapping and Surface Quality Verification™as new measurement requirements emerge. This modular architecture protects existing investments, simplifies future upgrades, and allows laboratories to purchase only the capabilities that best support their workflow. 

Whether performing routine thin-film thickness measurements, automated thickness mapping, or imaging-assisted measurement verification, users benefit from a common software platform, familiar workflows, and a flexible system designed to grow with their research and manufacturing needs. 

Designed for Solar Research and Manufacturing

The TF-Micro family is well suited for:

•       University research laboratories

•       National laboratories

•       Photovoltaic research centers

•       Pilot manufacturing facilities

•       Process development laboratories

•       Advanced materials research

•       Thin-film deposition laboratories

•       Industrial quality assurance

By combining optical spectroscopy, microscope imaging, automated mapping, and imaging-assisted verification within a common software environment, the TF-Micro family provides researchers with a flexible and expandable solution for precision thin-film characterization throughout the product development cycle. 

Additional Resources

Solar & Photovoltaic Thin-Film Measurement Systems

https://www.stellarnet.us/systems/thin-film-metrology/solar-photovoltaic-measurement/

Thin-Film Metrology Systems: https://www.stellarnet.us/systems/thin-film-metrology/ 

About StellarNet: Since 1991, StellarNet has designed and manufactured modular miniature spectrometers, optical spectroscopy systems, and application-specific measurement solutions for scientific research, industrial process monitoring, quality assurance, and OEM integration. The company's modular technologies support UV-Vis, NIR, Raman, fluorescence, radiometry, color measurement, microscopy, and thin-film metrology applications for researchers and manufacturers worldwide. 

Stephanie Boxel, Director of Sales and Marketing, StellarNet, Inc., 14390 Carlson Circle, Tampa, FL 33626 USA, +1 (813) 855-8687, www.stellarnet.us