Freeform Optical Measurement vs. Large-Aperture Optical Metrology

Physics-Driven Selection of a 3D Optical Surface Profiler

In high-precision optics, the challenge has shifted from raw resolution to matching measurement architecture with surface geometry. Whether utilizing differential confocal slope tracking or multi-wavelength interferometry, the selection must be driven by physics—not brand. This analysis explores the architectural trade-offs between the DUI NMF-1000 and Taylor Hobson LUPHOScan 850 HD to ensure metrology integrity across complex freeforms and large apertures.

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