Because silicon is transparent to SWIR light, InGaAs SWIR cameras can image through silicon wafers, detect moisture differences invisible to the eye, profile NIR and SWIR laser beams, and reveal surface and subsurface features in materials that appear featureless under visible illumination. Pembroke Instruments supplies InGaAs SWIR camera systems from uncooled VGA configurations to deeply TE-cooled extended-SWIR cameras, covering semiconductor inspection, machine vision, laser beam profiling, spectroscopy, microscopy, material sorting, and scientific research.
Use this page to compare 2 megapixel SWIR cameras, 1.3 MP SWIR cameras, uncooled VGA SWIR cameras, TE-cooled VGA SWIR cameras, high-speed qVGA SWIR cameras, deeply cooled SWIR cameras, and line-scan SWIR cameras. For application examples, see the SWIR camera applications guide or contact Pembroke for camera, lens, illumination, and software selection support.
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