Pembroke Instruments, LLC has expanded its compact spectrometer portfolio with three dedicated product families — ARIS, SIENA, and NYLIS — each engineered for a distinct spectral range and measurement need, from broadband UV-VIS work through to fine-resolution spectral analysis in the near-infrared.

Built into a small, rugged footprint, the new instruments are designed to bring laboratory-grade optical performance into portable devices, OEM instruments, and industrial process-monitoring systems, without the size, cost, or complexity typically associated with bench-scale spectrometers.

Three Spectrometers, Three Measurement Regimes

ARIS — Compact UV-VIS Spectrometer

ARIS is built for ultraviolet, visible, and VIS-NIR spectroscopy, with six wavelength configurations spanning 185–1100 nm. It uses a high-throughput, symmetrical Czerny-Turner optical design with a 50 mm focal length and very low stray light (0.08%), making it well suited to absorbance, transmission, and reflectance measurements in chemistry, coatings, water-quality testing, biotechnology assays, and industrial color measurement. Depending on configuration, ARIS pairs with a Toshiba CCD or Hamamatsu CMOS sensor, with resolution as fine as 0.33 nm FWHM in the UV configuration.

SIENA — Miniature NIR Spectrometer

SIENA extends compact spectroscopy into the near-infrared and SWIR, covering 800–2100 nm across three configurations built around an uncooled InGaAs detector (256 pixels). It offers the highest signal-to-noise ratio (1000) and dynamic range (12,000:1) of the three families, with a 30 mm focal length Czerny-Turner design. SIENA targets applications such as moisture analysis, polymer and food composition testing, agricultural inspection, and inline process analytics.

NYLIS — High-Resolution Compact Spectrometer

NYLIS is the resolution-focused member of the line, delivering FWHM resolution down to 0.06 nm across a 4096-pixel Hamamatsu CMOS sensor and a longer 120 mm focal length. Ten wavelength-band configurations are available between 380 and 1100 nm, making NYLIS suited to laser-line characterization, narrow spectral feature discrimination, and other precision spectral-analysis tasks where fine wavelength detail is critical.

At a Glance

All three share a common mechanical and interface philosophy: an SMA optical connector (with alternative interfaces available on request), an included detector lens, order-sorting filters where required, and support for compatible light sources and fiber-optic probes for absorbance, transmission, and reflectance measurements.

Matched Accessories for Faster Deployment

To simplify system integration, ARIS and SIENA are available with matched light sources and probes:

●       UV-VIS and UV-VIS-NIR deuterium/halogen sources for ARIS configurations, from deep-UV work below 400 nm through to broadband VIS-NIR

●       Tungsten halogen and quartz tungsten halogen sources for SIENA's NIR/SWIR range

●       Absorbance/transmission dip probes and reflectance probes, wavelength-matched to each spectrometer configuration, for liquid, coating, and solid-sample measurements

Applications

●       Chemical concentration and absorbance/transmission analysis

●       Thin-film, coating, and optical component characterization

●       Water quality and environmental monitoring

●       Material identification, moisture, and composition analysis

●       Food and agricultural inspection

●       Industrial color and inline process monitoring

●       Laser-line and precision spectral-feature measurement

●       OEM and portable instrument integration

Availability

ARIS, SIENA, and NYLIS are available now in multiple wavelength-range configurations, with supporting datasheets, light sources, and probes available on request. Engineering support is available to help match wavelength range, resolution, detector type, and optical geometry to specific measurement requirements, including OEM and industrial integration projects.

For technical datasheets or configuration assistance, contact Pembroke Instruments at [email protected]