S wide: Large Area 3D Profiler

June 30, 2021
The next metrology tool for wide areas

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.


Large Area 3D Optical Metrology System

  • Advanced manufacturing  
  • Archaeology & Paleontology  
  • Consumer electronics  
  • Medical devices  
  • Molding  
  • Optics  
  • Watch industry

Sub-micron height repeatability over entire extended area

One shot height measurement up to 40 mm without Z scanning

Bi-telecentric lenses with very low field distortion providing accurate metrology

Form deviation from 3D CAD models providing the geometric difference and tolerance measurement


Calibration of surface texture measuring instruments

All our systems are manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards following the ISO 25178 guidelines of part 7 for: Z amplification factor, XY lateral dimensions, flatness error, as well as parcentricity and parfocality.

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