Latest IR Cameras Featured at Laser 2003

April 14, 2003
Croissy-Beaubourg, France, April 14, 2003. The latest products from CEDIP Infrared Systems will be shown at several European exhibitions this summer. At Laser 2003 (23-26 June), CEDIP will showcase on stand 174 (Hall B2) the JADE SWIR, a new camera designed to meet the demanding infrared analysis requirements of spectroscopic test equipment for telecom and process monitoring applications

Croissy-Beaubourg, France, April 14, 2003. The latest products from CEDIP Infrared Systems will be shown at several European exhibitions this summer. At Laser 2003 (23-26 June), CEDIP will showcase on stand 174 (Hall B2) the JADE SWIR, a new camera designed to meet the demanding infrared analysis requirements of spectroscopic test equipment for telecom and process monitoring applications.

The JADE SWIR camera is sensitive from 0.8 - 2.5 microns and uses a MCT based focal plane array sensor cooled with a thermoelectric cooler to provide extremely high sensitivity and hence to capture in real-time high-speed dynamic events in snapshot readout mode. Coupled with CEDIP's intuitive PC-based analysis and reporting software ALTAIR, the system provides engineers with a cost effective solution for obtaining accurate thermal measurements in challenging test situations.

Also featuring prominently will be the EMERALD, a new high performance, large format (640x 512 pixel) IR camera. The EMERALD can operate up to 100 frames per second at full image size with output digitized over a complete 14-bits dynamic range. Capable of operating at 3-5 µm using InSb or HgCdTe focal plane arrays or 8-12 µm using quantum well focal plane arrays the EMERALD is a device well suited to a variety of applications including airborne imaging or long range surveillance.

For more information, visit www.cedip-infrared.com .

Laser Focus World

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