Laser autofocus system from Prior Scientific works with upright microscopes

The LF210 laser autofocus system provides microscopic examination of reflective samples, including semiconductor wafers and hard disk-drive platens.

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The LF210 laser autofocus system provides microscopic examination of reflective samples, including semiconductor wafers and hard disk-drive platens. It combines intelligent microprocessor control, advanced optics, and a modulated laser diode to deliver stable laser autofocus for upright microscopes and any infinity-corrected optical system.
Prior Scientific
Cambridge, Cambridgeshire, England

www.prior.com

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