Kentech Launches High Performance Pockels Cell Driver

July 25, 2002
Didcot, UK, July 25, 2002 -- Kentech Instruments Ltd. will launch one of the world's highest repetition rate Integrated Pockels Cell Drivers this year at Photonex 2002 exhibition in Cardiff, Wales.

Didcot, UK, July 25, 2002 -- Kentech Instruments Ltd. will launch one of the world's highest repetition rate Integrated Pockels Cell Drivers this year at Photonex 2002 exhibition in Cardiff, Wales.

Kentech's new Pockels cell system has been developed at its UK research and development headquarters. It can be configured as a "Q" switch or a pulse in/out system for regenerative amplifers. A variety of low capacitance Pockels cells can be accommodated with BBO cells being recommended for operation above 10kHz. Transition times of ~2ns can be achieved, with repetition rates to many tens of kHz, depending exactly on the configuration required.

Among Kentech's customers are the Lawrence Livermore National Laboratory in California, the Los Alamos National Laboratory in New Mexico, the LLE (Laboratory for Laser Energetics) in Rochester, USA, CEA of France and the University of Osaka of Japan.

Kentech, which was launched in 1983, specializes in the manufacture of high voltage fast pulse generator systems, x-ray streak cameras and gated imaging detectors. High voltage switching electronics is central to many of its products and it is able to respond to unusual requests for high-speed instruments.

Its product range includes optical and X-ray imaging systems with time resolution <100ps, high voltage solid state pulse generators with amplitudes up to more than 24kV with 100ps risetime, high repetition rate gated intensifier systems for use with lasers and pulse generators designed for many applications including laser switching.

The pulse generators have applications in radar, lasers, EMC testing, high-speed electro-optics and time of flight particle instrumentation. Optical gated imaging systems are used in such applications as florescence lifetime imaging {FLIM}, laser produced plasma diagnostics, LIDAR, imaging through turbid media and imaging spectroscopy.

Kentech's X-ray instruments include various X-ray streak cameras, which are designed specifically for plasma diagnostics, and electronics to drive gated microchannel plate X-ray detectors for two dimensional gated imaging.

For more information, visit www.kentech.co.uk.

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