The End Point Detection product family for monitoring and control of the chemical processing of novel materials performs measurements in either reflection or transmission geometry, and provides spectral characterization of the process at discrete wavelengths. Instruments cover the 350–950 nm range, with custom versions in the UV and up to 1500 nm available.
Sunrise Optical
Sunrise, FL
www.zebraoptical.com/epd.html
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March 31, 2025
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