• Flat-field spectrometer from H+P Spectroscopy for XUV/EUV/soft x-ray

    A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device.
    Jan. 20, 2015

    A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device. Signal strength is approximately a factor of 20 times higher than with slit-type systems. Applications include plasma and attosecond research, as well as fusion technology and extreme UV source calibration.
    H+P Spectroscopy
    Mannheim, Germany
    www.hp-spectroscopy.com

    More Products

    -----

    Follow us on Twitter

    Subscribe now to Laser Focus World magazine; it's free!

    Sign up for Laser Focus World Newsletters
    Get the latest news and updates.

    Voice Your Opinion!

    To join the conversation, and become an exclusive member of Laser Focus World, create an account today!