Flat-field spectrometer from H+P Spectroscopy for XUV/EUV/soft x-ray

    Jan. 20, 2015
    A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device.
    1501prod Hpspect 611ff23c05a76

    A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device. Signal strength is approximately a factor of 20 times higher than with slit-type systems. Applications include plasma and attosecond research, as well as fusion technology and extreme UV source calibration.
    H+P Spectroscopy
    Mannheim, Germany
    www.hp-spectroscopy.com

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