Flat-field spectrometer from H+P Spectroscopy for XUV/EUV/soft x-ray

A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device.
Jan. 20, 2015
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A flat-field spectrometer for the XUV/EUV/soft x-ray spectral range offers direct source imaging in a compact, modular device. Signal strength is approximately a factor of 20 times higher than with slit-type systems. Applications include plasma and attosecond research, as well as fusion technology and extreme UV source calibration.
H+P Spectroscopy
Mannheim, Germany
www.hp-spectroscopy.com

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