• Zeiss laser FIB-SEM microscope integrates a femtosecond laser

    The Crossbeam Laser family are site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages.
    May 25, 2020
    Zeiss 5e960526c2ecf

    The Crossbeam Laser family are site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages. It integrates a femtosecond laser for speed, a gallium ion (Ga+) beam, and SEM for nanoscale-resolution imaging with minimal sample damage.

    Zeiss

    Oberkochen, Germany

    www.zeiss.com/pcs

    Sign up for Laser Focus World Newsletters
    Get the latest news and updates.

    Voice Your Opinion!

    To join the conversation, and become an exclusive member of Laser Focus World, create an account today!