Zeiss laser FIB-SEM microscope integrates a femtosecond laser

    May 25, 2020
    The Crossbeam Laser family are site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages.
    Zeiss 5e960526c2ecf

    The Crossbeam Laser family are site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages. It integrates a femtosecond laser for speed, a gallium ion (Ga+) beam, and SEM for nanoscale-resolution imaging with minimal sample damage.

    Zeiss

    Oberkochen, Germany

    www.zeiss.com/pcs

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