Imaging module combines AFM and Raman spectroscopy for life sciences

July 12, 2010
Veeco Instruments Inc.'s Integrated AFM-Raman Imaging System (IRIS) Module for Veeco atomic force microscopes enables combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with nanoscale mechanical, electrical and thermal AFM characterization.

Veeco Instruments Inc.'s (Plainview, NY) Integrated AFM-Raman Imaging System (IRIS) Module for Veeco atomic-force microscopes enables combining chemical or crystallographic information (Raman spectroscopy) at high spatial and spectral resolution, with nanoscale mechanical, electrical and thermal AFM characterization. The IRIS Module supports both the Innova and BioScope Catalyst AFM Systems, providing combined-technique experiment control for advanced research in life sciences applications. High tip preservation and low drift guarantee preserved alignment, even over the optical integration times necessary to interrogate weak Raman scatterers.

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