
As optical systems for space telescopes, defense, and satellite communications evolve, they demand increasingly precise manufacturing and measurement standards. A key challenge lies in accurately assessing both vertical and lateral resolution in optical components, as traditional metrology tools often sacrifice one for the other. This trade-off can obscure critical surface defects, leading to underperforming systems.
The Instrument Transfer Function (ITF) has emerged as a vital metric for evaluating the fidelity of optical measurements across varying spatial frequencies. ITF quantifies how well an interferometer captures the true surface profile of an optic, especially as feature sizes shrink. A high ITF ensures that even fine surface variations are accurately measured, which is essential for high-power laser systems and freeform optics.Given the longevity and cost of interferometers, understanding and optimizing ITF is crucial for manufacturers aiming to future-proof their optical systems.