Ophir® BeamPeek™ Software for field technicians is easy-to-use beam analysis software for fast, accurate, real-time measurement of lasers in additive chambers. Designed for field maintenance, the system analyzes critical beam parameters and provides a comprehensive view of the beam’s shape, size, and intensity distribution, facilitating rapid identification of irregularities or deviations.

Mad City Labs piezo nanopositioners offer sub-nanometer precision and high stability under closed loop control. Micropositioners with 95nm step size to bridge the gap between micro and nanoscale. New! QS-PLL™ AFM controller and Mad-Deck™ XYZ automated stage platform. Ideal for quantum sensing, metrology, photonics and advanced microscopy applications. Lead times < 60 days!

CODE V and LightTools provide a powerful workflow to identify and minimize the effects of stray light in optical systems prior to manufacturing. Learn about our workflow using a smartphone camera system as an example.