B&W Tek to showcase smart spectrometer at SPIE BiOS and Photonics West 2016

The Exemplar Plus LS smart spectrometer uses an aberration-corrected concave holographic grating to minimize stray light. Its long focal length, coupled with a high-quantum-efficiency detector, provides data over the 190–1100 nm spectral range. Features include a high signal-to-noise ratio for low-light-level applications and a built-in shutter for dark scan measurements, even while illuminated.

SPIE BiOS/Photonics West booth numbers: 8620 (BiOS) and 2529 (Photonics West)

To Learn More:

Contact:B&W Tek
Headquarters: Newark, DE
Product: Exemplar Plus LS smart spectrometer
Key Features: Data over the 190–1100 nm spectral range

What B&W Tek says:
View more information on the Exemplar Plus LS smart spectrometer.

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