• Olympus IMS to display laser confocal microscope system at SPIE Photonics West 2015

    The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis.
    Jan. 29, 2015

    The LEXT OLS4100 laser confocal microscope system delivers nanometer-level imaging, accurate 3D measurement, and surface roughness analysis. Features include new auto brightness and high-speed stitching modes.

    SPIE Photonics West booth number: 5322

    To Learn More:

    Contact: Olympus IMS
    Headquarters: Center Valley, PA
    Product: LEXT OLS4100 laser confocal microscope system
    Key Features: Auto brightness and high-speed stitching modes

    What Olympus IMS says:
    View more information on the LEXT OLS4100 laser confocal microscope system.

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