Ophir to showcase scanning-slit beam profiler at LASER World of Photonics China 2017

March 6, 2017

The NanoScan 2 scanning-slit beam profiler measures beam size and position to sub-micron resolution.

The NanoScan 2 scanning-slit beam profiler measures beam size and position to sub-micron resolution. It is available with a silicon, germanium, or pyroelectric detector for profiling lasers from the UV to 100 µm and beyond. The beam profiler handles high-power beams without complicated attenuation schemes, and measures waist location to within ±25 µm. Its NanoScan 2s software measures from one to 16 beams and provides real-time results display.

LASER World of Photonics China booth number: 1100

To Learn More:

Contact:Ophir-Spiricon
Headquarters: North Logan, UT
Product: NanoScan 2 scanning-slit beam profiler
Key Feature: Available with a silicon, germanium, or pyroelectric detector

What Ophir-Spiricon says:
View more information on the NanoScan 2 scanning-slit beam profiler.

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