<?xml version="1.0" encoding="utf-8"?><urlset xmlns="http://www.sitemaps.org/schemas/sitemap/0.9" xmlns:news="http://www.google.com/schemas/sitemap-news/0.9" xmlns:image="http://www.google.com/schemas/sitemap-image/1.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.sitemaps.org/schemas/sitemap/0.9 http://www.sitemaps.org/schemas/sitemap/0.9/sitemap.xsd http://www.google.com/schemas/sitemap-news/0.9 http://www.google.com/schemas/sitemap-news/0.9/sitemap-news.xsd"><url><loc>https://www.laserfocusworld.com/directory/positioning-support-equipment/positioning-sensing-equipment/press-release/55401125/pi-americas-physik-instrumente-pis-angstrom-level-resolution-piezo-stage-for-afm-metrology-and-advanced-imaging</loc><news:news><news:publication><news:name>Laser Focus World</news:name><news:language>en</news:language></news:publication><news:publication_date>2026-08-25T21:43:00.000Z</news:publication_date><news:title>PI's Angstrom-Level Resolution Piezo Stage for AFM, Metrology, and Advanced Imaging</news:title></news:news></url></urlset>