Continuous Reflective Interface Sample Placement (CRISP )

Feb. 7, 2017
Eliminates focus drift in high-power microscopy applications by sensing minute changes between the objective lens and the specimen’s cover slip allowing a specimen to remain accurately focused for hours at a time with an accuracy of 5% of the objective depth of focus and maintaining focus while scanning in XY

By clicking above, I acknowledge and agree to Endeavor Business Media’s Terms of Service and to Endeavor Business Media's use of my contact information to communicate with me about offerings by Endeavor, its brands, affiliates and/or third-party partners, consistent with Endeavor's Privacy Policy. In addition, I understand that my personal information will be shared with any sponsor(s) of the resource, so they can contact me directly about their products or services. Please refer to the privacy policies of such sponsor(s) for more details on how your information will be used by them. You may unsubscribe at any time.