The BX53M system microscope for metallurgical analysis features an LED illuminator that enables users to change observation methods by turning a dial. A directional darkfield advanced imaging function illuminates the sample from the side with the ability to control the direction from a handset or the company's OLYMPUS Stream 2.1 image analysis software, and a MIX function combines directional darkfield with brightfield, polarized light, or fluorescence. A 150 × 100 mm flat-top stage accommodates larger samples.
SPIE Photonics West booth number: 5154
To Learn More:
Contact: Olympus IMS
Headquarters: Waltham, MA
Product: BX53M system microscope
Key Features: LED illumination for switching between observation methods
What Olympus IMS says:
View more information on the BX53M system microscope.
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