Contour Elite 3D optical microscopes integrate high-definition microscopy imaging with 3D white light interferometry-based optical surface metrology functionality. Simultaneous acquisition of nanometer-scale metrology data and high-definition color imaging is available on a single platform. The microscopes have uses in sample characterization in research institutions, industrial R&D facilities, and QA/QC labs.
Bruker
Billerica, MA
www.bruker.com