Better autofocus systems for metrology, biophotonics goal of Piezosystem Jena and Focal Point partnership

04/11/2012

Hopedale, MA and Boise, ID--Piezosystem Jena and Focal Point have announced a new partnership to deliver turnkey autofocus systems for high-speed metrology and biological imaging applications. "Focal Point's extensive experience in semiconductor and printing technology applications nicely complements our knowledge of the super-resolution microscopy field. Bringing both technologies together will open up new possibilites in test, measurement and biological research," said Jim Litynski, CEO of Piezosystem Jena.

The effects of thermal drift on systems are becoming increasingly important since the advent of super-resolution microscopes and the introduction of complex imaging techniques for biology. Also, direct-write optical processing is an expanding field that is making inroads into more traditional photolithography methods. Both applications require nanometer-scale stability between sample and lens. 

"We fill a need in the market right now for very robust systems insensitive to tilt and diffraction effects often common in industrial settings and we will be releasing even more dramatic improvements in focus measurement and control technology in the near future--stay tuned for exciting new developments," said Dan Marshall, CTO of Focal Point.

 SOURCE: Piezosystem Jena and Focal Point; www.piezosystem.com and www.focal-pt.com

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