Toptica introduces ultrafast erbium fiber laser systems

July 30, 2004
Munich, Germany, July 30, 2004--Modelocked femtosecond lasers have nowadays found their way into a widespread variety of both scientific and industrial applications. With the newly released Femtofiber Series, TOPTICA Photonics merges the performance of traditional Ti:Sapphire oscillators with the stability of an all-fiber laser source.

Munich, Germany, July 30, 2004--Modelocked femtosecond lasers have nowadays found their way into a widespread variety of both scientific and industrial applications. With the newly released Femtofiber Series, TOPTICA Photonics merges the performance of traditional Ti:Sapphire oscillators with the stability of an all-fiber laser source. Combining pump sources, a modelocked ring oscillator, up to two parallel amplifiers and optical pulse compression in a single compact housing, the FFS offers a maximum of user-convenience and flexibility without compromising performance.

The release of TOPTICA's new modelocked Er:fiber laser systems FFS Femtofiber Series marks a significant step towards the availabilty of cutting-edge femtosecond technology as a standard tool in any research environment. Based on direct pumping from fiber-pigtailed laser diodes and fiber integrated, reliable telecom components, the FFS delivers 180 mW of linearly polarized and highly stable output power in sub-100 fs pulses from a user-friendly and compact design.

The laser emission wavelength of 1.55 µm is compatible with today's optical telecom standard and facilitates studies of technologically relevant devices and materials. Optionally, the output may be frequency-doubled if return to the Ti:Sapphire wavelength range is desired. As a unique feature, the FFS is available with a special continuum generation stage, permitting the generation of ultrabroadband output spectra with a coverage of more than one full octave in bandwidth. In this way, the frequency comb emitted from the modelocked oscillator can be conveniently characterized in an f-2f scheme for frequency metrology applications. Analog feedback inputs for active control over the frequency comb parameters are provided upon request. As a further feature, the wavelength of maximum spectral intensity in the nonlinearly broadened spectrum may be manually shifted over several hundred nanometers for spectroscopic studies in extended spectral windows.

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